展版-XPS改

  X-射线光电子能谱仪

 

仪器型号:Sigma Probe   英国Thermo VG公司  2002年购置

                            

主要性能:双阳极 Mg/Al靶

          单色器 最小分析区域15微米  能量分辨率 0.47eV

          配备中和枪、氩离子枪、五轴样品台

主要功能:

1.   全扫谱图(Survey spectrum):

2.   窄扫定量:
(Quantitative analysis with narrowscan)        

 

 

Name

Centre  BE

Height  Counts

FWHM  eV

At.  %

Al2p

74.8

231.65

1.74

1.69

O1s

533

33919.82

2.21

58.19

Si2p

103.7

6374.4

2.14

36.74

Na1s

1072.4

4041.37

2.29

3.38

 

3.化学状态分析:(Chemical state analysis)

4.深度剖析 (Depth profile)

 

X-ray photoelectron spectrum

Type:  Sigma Probe,Thermo VG, 2002

Specifications: Twin Anode (Mg, Al),  Mono-chronometer (minimum spotsize 15um),

         Energyresolve 0.47eV

         Flood gun,ion gun, 5-axis sample stage

Application: Analyzing chemical states and relativecontents of elements on sample surface

 

 

 

 

 

信息来源: 
2017-02-09