多晶X射线衍射仪

仪器型号：X’ Pert-MPD   厂家：Philips   1997年购置

主要技术参数：

X光管：阳极为长细焦斑型Cu靶材，功率³2.2KW

测角仪：角度（2q）测量范围：0～167°

角度（2q）重现性：±0.0001°

角度（2q）准确度：±0.0025°

扫描速度范围：0.1～60°/分

最小步进：0.0001°

探测器：NaI闪烁计数器

附件：薄膜附件，配备充氙（Xe）正比计数器

基本功能：测量粉末或固体样品的物相组成、晶胞参数、晶粒大小及分布、结晶程度，微观应力、织构等结构参数。

应用领域：该仪器广泛应用于化工、环境、地质、冶金、材料科学等领域的科学研究与质量检测。

          分子筛SAPOXRD谱图                                             聚烯烃催化剂XRD谱图

       XRD diffraction of Zeolite SAPO                XRD patterns of the catalysts forpolyolefin

            苯酐催化剂XRD谱图                                            不同制备方法得到的聚酯XRD谱图

     XRD patterns of the catalyst for                            XRD patterns of polyester prepared

            phthalic anhydride                                                    by different methods

X-RAYDIFFRACTOMETER

Type： X’ Pert-MPD manufactured by PHILIPS

Specifications：

X-ray generator: Anodematerial Cu, Power³ 2.2KW

Gonionmeter:2 thetameasurement range : 0~167°

Reproducibility: ±0.0001°

Accuracy: ±0.0025°

Scan speed range:0.1~60°/min

Minimum step size：0.0001°

Detectors: NaIscintillation counter, Xenon filled proportional detector

Application: X-raydiffraction is a versatile, non-destructive analytical technique foridentification and quantitative determination of the various crystalline formsof compounds present in powdered and solid samples. Now X-ray diffractometer iswidely applied in the scientific research and quality inspection of such manyfields as chemical engineering, environment, geology, metallurgy, materialscience and so on.